Omron STC-LBS34U3V-SWIR Wide-Band High-Sensitivity SWIR USB3 Vision Camera with Sony IMX991, 0.3 MP, C-Mount

SKU
Omron STC-LBS34U3V-SWIR
$17,767.50
Quick Overview

*Please note tariff fee is included in price*

0.3 MP Omron SWIR camera featuring the Sony IMX991 global shutter sensor, 400–1,700 nm sensitivity, USB3 Vision interface, 656 × 520 resolution at up to 258 fps, and C-mount lens support with optional Peltier cooling.

NDAA Compliant

The Omron STC-LBS34U3V-SWIR is a wide-band, high-sensitivity SWIR camera engineered for precise imaging from the visible edge into the short-wave infrared spectrum, covering approximately 400 nm to 1,700 nm. Powered by the Sony IMX991 InGaAs global shutter sensor and offering 0.3 megapixel resolution at 656 × 520, this camera delivers clean, low-noise images at frame rates up to 258 fps for fast-moving processes and demanding inspection lines.

With its USB 3.0 / USB3 Vision interface, C-mount lens compatibility, and optional Peltier cooling support, the STC-LBS34U3V-SWIR integrates easily into existing machine vision and scientific imaging systems. The robust aluminum housing and area-scan architecture make it well suited for applications such as material sorting, laser beam profiling, moisture detection, and electronics inspection where SWIR contrast reveals details invisible in standard visible-light cameras.

Features:

  • Wide-band SWIR sensitivity (approx. 400–1,700 nm) for visible-to-SWIR imaging in a single compact camera
  • 0.3 MP (656 × 520) resolution optimized for high-speed, high-sensitivity SWIR inspection tasks
  • Sony IMX991 InGaAs global shutter sensor for low-noise, high-contrast SWIR imaging at full frame rates
  • USB 3.0 / USB3 Vision interface for high-bandwidth, low-latency data transfer and broad software compatibility
  • C-mount lens interface offering flexible lens selection for different working distances and fields of view
  • Up to 258 fps at full resolution to support fast production lines and dynamic test scenarios
  • Area-scan architecture for capturing full-frame images in inspection, measurement, and research applications
  • Peltier cooling support (model-level capability) to improve stability and reduce dark noise in thermally sensitive setups
  • Durable aluminum black housing designed for integration into industrial machine vision environments

Applications:

  • Material sorting
  • Silicon inspection
  • Moisture detection
  • Food grading
  • Solar cells
  • Electronics QA
  • Laser profiling
  • Glass inspection
  • Chemical analysis
  • Process monitoring
Camera TypeSWIR (Short-Wave Infrared) Area Scan Camera
ModelSTC-LBS34U3V-SWIR
ManufacturerOmron
Image Sensor TypeSony IMX991 InGaAs, Global Shutter
Image Sensor Format1/4"
Spectral Sensitivity RangeApprox. 400 nm to 1,700 nm
Resolution0.3 MP (656 × 520 pixels)
Image Width656 pixels
Image Height520 pixels
Pixel Size5 µm
Frame RateUp to 258 fps
Scan TypeArea scan
Lens MountC-mount
Lens TypeNot applicable (lens not included)
Optical FilterNone (no built-in filter)
InterfaceUSB 3.0 (USB3 Vision)
Shutter TypeGlobal shutter
Cooling SupportPeltier cooling supported (model-level capability)
Housing MaterialAluminium, black