CIS Pixel-shift Cameras utilize advanced piezo-actuator mechanisms to deliver ultra-high-resolution images that surpass traditional sensor limitations. By shifting the sensor across sub-pixel increments and compositing multiple exposures, these cameras achieve remarkable image clarity and detail—ideal for precision inspection and measurement. Integrated with a robust CoaXPress interface, CIS Pixel-shift Cameras ensure high-speed, stable data transmission for demanding industrial environments.
Engineered for applications requiring microscopic accuracy and broad spectral sensitivity, these cameras feature global shutter SWIR sensors covering 400–1700 nm. This combination enables the capture of both visible and short-wave infrared characteristics, making them indispensable for semiconductor wafer analysis, PCB inspection, food and agricultural assessment, pharmaceutical coating verification, and automated processes where submicron accuracy is essential.
Engineered for applications requiring microscopic accuracy and broad spectral sensitivity, these cameras feature global shutter SWIR sensors covering 400–1700 nm. This combination enables the capture of both visible and short-wave infrared characteristics, making them indispensable for semiconductor wafer analysis, PCB inspection, food and agricultural assessment, pharmaceutical coating verification, and automated processes where submicron accuracy is essential.
